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Division Eqipment Specification
Fisher Sub-Sieve Sizer ASTM B 330
Particle Size Analyzer HORIBA
Carbon Determinator LECO
N2/O2 Determinator LECO
X-ray Diffractometer PHILIPS
Inductively Coupled Plasma LEEMAN
Dilatometer NETZSCH
Mounting Press
Struers
Automatic Polisher
Struers
Optical Microscope OLYMPUS
Stereo Microscope ASAHI
Image Analyzer Media Cybernetics
SEM & EDS HITACHI
Rockwell Hardness Tester
Akashi
Vickers Hardness Tester
Akashi
Coercimeter
SUKJIN
Magnetic Saturation Analyzer LDJ
Universal Tester
DAEKYUNG
High temperature Microscope Union